Extending the analytical capabilities of the existing xray fluorescence spectrometer for the analysis of Rare earth elements

Abstract

This study aims at extending the analytical capabilities of an existing X-ray fluorescence spectrometer, in order to provide accurate, cost-effective analytical technique for REEs analysis. This was achieved through the integration of Am-24l excitation-based system into the existing Ag anode-Xray tube spectrometer (EXP-I) in the X-ray fluorescence (XRF) laboratory of Ghana Atomic Energy Commission (GAEC) for the analysis of rare-earth elements (REE). With the attached Am-241 excitation-based system the following REEs were identified and quantified;Sc, y, La, Ce, Nd, Sm, Eu, Cd and ET. The "Elemental Sensitivities Method" was employed in the development of the quantitative analysis of the identified REEs. These results were confirmed by the Instrumental Neutron Activation Analysis (INAA) and the Inductively Coupled Plasma Mass Spectrometer (ICP-MS) analytical technique. On the other hand, the current EXP-I could only identify and quantify the following REEs; Sc ,Y, and Eu. Comparative analysis of the results of the Am-241 excitation-based system with ICP-MS and INAA technique established 80% of the reliability and accuracy of the attached Am- 241 excitation-based system as alternative for analysis of REEs. This was confirmed by the statistical results which gave R2 values higher than 0.95, slopes close to I, and intercept close to zero (0). This means that, the results obtained using the two methods were not found to be significantly different for REEs. Consequently, the attached Am-24Iexcition-based expanded the scope of analysis of REE elements for the existing XRF spectrometer (EXP-I). From the validation using the IAEA-Soil 7 reference standard.